Multi layer plastic films and sheet for food packaging.
Barrier Film/Sheet (Layer Measurement)
←
8 m →
XRS thickness gauges are available in widths of up to 8 m
≤ 0,2 μm
Ultra-precise thickness measuring with an accuracy of ≤ 0,2 µm
Measuring Principle
KAPA (for total thickness)
It is based on a non-contact, indirect thickness measurement principle. The capacitance between sensor and roller depends on dielectric of measured sheet and distance between sensor to roller. To eliminate the influence of distance-fluctuations between sensor to roller this distance is measured permanently with an eddy current sensor (located together with capacitive sensor in the same casing). According to this measured distance the result of capacitive sensor is corrected.
IR (for the EVOH layer)
It is based on a non-contact, transmission measurement principle. For the determination of the EVOH layer thickness, a wide infrared spectrum of the plastic is recorded and the resulting absorption of the EVOH polymer molecules is evaluated by using our modern analytic methods.
Technical Specifications
Technical Data
KAPA
IR
Measuring System
Capacitive/eddy current
Infrared
Thickness range
Up to 3 mm
> 5 µm*
Measuring gap
4.4 mm
35 mm
Sensor resolution
≤ 0.1 µm
0.5 µm
Repeatability
≤ ± 0.5 µm
≤ 2 µm*
Measurement speed
10-300 mm/s adjustable
25 mm/s adjustable
Calibration
necessary for each material
* Depending on product and calibration.
Please download the PDF data sheet for detailed technical specifications!
Our experts are always available for your inquiries and technical consultation. Please contact us anytime at our HQ or refer to local SBI Mechatronik representatives in your country!